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dc.contributor.authorReusen, Evelien
dc.contributor.authorStouthuysen, Kristof
dc.contributor.authorVan den Abbeele, Alexandra
dc.contributor.authorSlabbinck, Hendrik
dc.date.accessioned2019-11-22T13:34:04Z
dc.date.available2019-11-22T13:34:04Z
dc.date.issued2019en_US
dc.identifier.doi10.1111/jscm.12216
dc.identifier.urihttp://hdl.handle.net/20.500.12127/6416
dc.description.abstractThis study investigates the imitative use of management practices across a multitier supply network. Although imitation may take the form of any management practice, operationally, we focus on whether the buyer's control practices used with first‐tier suppliers results in similar control practices being used by these first‐tier suppliers with the second‐tier suppliers. Drawing on institutional theory, we identify relational context (i.e., affective commitment) and environmental context (i.e., environmental uncertainty) as two important factors influencing the extent to which such imitation takes place. Using unique survey data of vertically linked supply chain triads, we generally find support for the occurrence of imitation and more so in cases of high affective commitment. The results regarding environmental uncertainty further reveal selectivity in imitative behavior, calling attention to the level of deliberateness in imitation decisions in supply networks. Besides contributing to theory on imitative behaviors in the supply chain, this study also generates practical implications on the spread of management practices across multiple tiers.en_US
dc.language.isoenen_US
dc.publisherWileyen_US
dc.subjectSupply Networksen_US
dc.titleImitation of management practices In supply networks: Relational and environmental effects (Published Online)en_US
dc.identifier.journalJournal of Supply Chain Managementen_US
dc.contributor.departmentKU Leuvenen_US
dc.contributor.departmentGhent Universityen_US
dc.identifier.eissn1745-493X
vlerick.knowledgedomainAccounting & Financeen_US
vlerick.typearticleJournal article with impact factoren_US
vlerick.vlerickdepartmentAFen_US
dc.identifier.vperid142755en_US
dc.identifier.vperid119751en_US


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